DocumentCode
3527787
Title
The large-angle photon veto system for the NA62 experiment at CERN
Author
Ambrosino, F. ; Antonelli, A. ; Costantini, F. ; Filippo, D. Di ; Fantechi, R. ; Lamanna, G. ; Leonardi, E. ; Mannelli, I. ; Massarotti, P. ; Moulson, M. ; Napolitano, M. ; Palladino, V. ; Raggi, M. ; Saracino, G. ; Spadaro, T. ; Valente, P. ; Venditti, S
Author_Institution
Dipt. di Sci. Fis., Univ. di Napoli, Naples, Italy
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
852
Lastpage
855
Abstract
The NA62 experiment at the CERN SPS will measure the branching ratio for the decay K+ → π+ v- to within ≈10%. The large-angle veto (LAV) detectors must detect photons with energies as low as 200 MeV with an inefficiency of less than 10-4. After a comprehensive series of comparative studies, NA62 decided to base the LAV system on the lead-glass block/PMT assemblies recycled from the OPAL barrel calorimeter, and a prototype veto station, complete with front-end electronics, was constructed and tested in 2009. Eleven additional stations are to be constructed before data taking begins in 2012. We describe the design, construction, and testing of the LAV system, including the recovery and mechanical adaptation of the OPAL hardware, issues related to operation in high vacuum, HV distribution, and in-situ monitoring, and especially, the design of an efficient and economical system for the readout of time and energy over an extended dynamic range.
Keywords
kaon decay; meson decay; particle calorimetry; photomultipliers; readout electronics; semileptonic decays; CERN SPS; NA62 experiment; OPAL barrel calorimeter; OPAL hardware; PMT assemblies; front-end electronics; kaon+ decay pion++neutrino+antineutrino; large-angle photon veto system; lead-glass block; mechanical adaptation; prototype veto station; readout electronics; Charge measurement; Detectors; Energy resolution; Lead; Mesons; Photonics; Time measurement; calorimeter; detector; photon; veto;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5873882
Filename
5873882
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