DocumentCode
352796
Title
Vegetation profile estimates from multialtitude, multifrequency radar interferometric and polarimetric data
Author
Treuhaft, Robert N. ; Law, Beverly E. ; Asner, Gregory P. ; Hensley, Scott
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
126
Abstract
Forest vegetation profiles are key inputs to biomass determination and ecosystem modeling. With the advent of radar interferometry, microwave remote sensing is directly sensitive to the distribution of vegetation in the vertical direction. Polarimetry and polarimetric interferometry further enhance vertical-profile determination. Parameter estimation driven by simple physical models of vegetation scattering yields quantitative estimates of parameteres such as vegetation height and the dimensions of vegetation layers and their relative scattering strengths. The analysis of a JPL TOPSAR data set collected in April 1998 over Central Oregon focuses on the relative contributions of interferometric, polarimetric, and multifrequency data types to improving vegetation parameter-estimate accuracy. This data set consists of vertical-polarization interferometry at three radar altitudes, 8 km, 4 km, and 2 km at C-band (5-cm wavelength) and L-band (25 cm), and full polarimetry at C-, L-, and P-(80 cm) bands. After a brief description of the data set, a description of the simple physical model used to estimate vegetation profile parameters is followed by a description of the data set and the results
Keywords
forestry; geophysical techniques; radar cross-sections; radar polarimetry; remote sensing by radar; vegetation mapping; 5 to 80 cm; C-band; L-band; Oregon; P-band; biomass; canopy structure; forest; geophysical measurement technique; multialtitude; multifrequency radar; radar interferometry; radar polarimetry; radar remote sensing; vegetation height; vegetation mapping; vegetation profile; vertical-profile; Biomass; Ecosystems; Parameter estimation; Polarimetry; Radar interferometry; Radar scattering; Remote sensing; Scattering parameters; Vegetation; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location
Honolulu, HI
Print_ISBN
0-7803-6359-0
Type
conf
DOI
10.1109/IGARSS.2000.860443
Filename
860443
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