Title :
Comparing medium models to physical media via MFM imagery
Author :
Miller, Clayton T. ; Indeck, Ronald S. ; O´Sullivan, Joseph A. ; Muller, Marcel W.
Author_Institution :
Magnetics & Inf. Sci. Center, Washington Univ., St. Louis, MO, USA
Abstract :
In this study, magnetic force microscopy (MFM) images are utilized as bases of comparison for recording media and a micromagnetic model. Simulated MFM data generated from instances of the model are compared to real measurements. The model magnetization can be adjusted to optimize the cross-correlation between the simulated image and real data. The model film is comprised of uniformly magnetized grains which form a Voronoi tesselation of the film plane. The grain magnetization vectors have the same magnitude, lie in the plane of the film, and do not vary through the thickness of the film. The MFM imaging process is modeled as convolution of magnetic charges with a tip point spread function (PSF). These charges occur at discontinuities along grain boundaries.
Keywords :
grain boundaries; image processing; magnetic force microscopy; magnetic recording; magnetic thin films; magnetisation; micromagnetics; optical transfer function; MFM; Voronoi tesselation; cross-correlation; grain boundaries; grain magnetization vectors; magnetic charge convolution; magnetic force microscopy; micromagnetic model; model film; point spread function; recording media; Anisotropic magnetoresistance; Magnetic force microscopy; Physics;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1463524