• DocumentCode
    3528095
  • Title

    The performance of GridPix detectors

  • Author

    Bilevych, Y. ; Carballo, V. M Blanco ; Fransen, M. ; van der Graaf, H. ; de Groot, N. ; Hartjes, F. ; Hessey, N. ; Konig, A. ; Koppert, W.J.C. ; Rogers, M. ; Schmitz, J. ; Schön, R. ; Timmermans, J. ; Visschers, J.

  • Author_Institution
    Nikhef, Amsterdam, Netherlands
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    944
  • Lastpage
    948
  • Abstract
    A GridPix detector is a gaseous detector capable of detecting individual single primary electrons from ionizing particles. Such a detector consists of a pixel chip as active anode covered with a thin layer of silicon rich silicon nitride (SiRN) for protection against discharges, an integrated amplification grid (InGrid), applied on top of the chip by wafer post processing techniques, and a cathode plane. The drift region is between the grid and cathode while the gas gain occurs between the chip and the grid. The discharge quenching properties of the SiRN layer have been determined as well as the relation on grid capacitance, grid voltage and gas mixture. Part of the detectors in this report were of the type Gossip, a GridPix detector with a drift gap of ~1 mm. Using such thin drift layer, one may consider this detector as a replacement for a silicon pixel detector. The performance of three Gossip detectors has been investigated by measurements in a test beam at CERN.
  • Keywords
    electron detection; silicon radiation detectors; CERN; Gossip detector; GridPix detector; discharge quenching properties; drift region; electron detection; gas mixture; gaseous detector; grid voltage; integrated amplification grid; pixel chip system; silicon pixel detector; silicon rich silicon nitride; test beam measurement; wafer post processing technique; Capacitance; Charge measurement; Detectors; Discharges; Pixel; Semiconductor device measurement; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873901
  • Filename
    5873901