• DocumentCode
    35283
  • Title

    Applicability of Redundant Pairs of SOI Transistors for Analog Circuits and Their Applications to Phase-Locked Loop Circuits

  • Author

    Makihara, A. ; Yokose, Takeshi ; Tsuchiya, Y. ; Miyazaki, Yuji ; Abe, H. ; Shindou, H. ; Ebihara, Tadashi ; Maru, A. ; Morikawa, Kota ; Kuboyama, Satoshi ; Tamura, Takuya

  • Author_Institution
    High Reliability Eng. Corp., Tsukuba, Japan
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    Redundant pairs of SOI transistors have been utilized as a Radiation Hardening-By-Design technique. Their applicability was subsequently extended for analog circuits, such as current mirror circuits, and successfully demonstrated with a phase-locked loop circuit.
  • Keywords
    analogue integrated circuits; current mirrors; phase locked loops; radiation hardening (electronics); silicon-on-insulator; SOI transistors; Si; analog circuits; current mirror circuits; phase-locked loop circuits; radiation hardening; redundant pairs; Analog circuits; Ions; Mirrors; Phase locked loops; Switches; Transistors; Voltage-controlled oscillators; Phase-locked loop circuits; SOI; radiation hardening-by-design; single-event effects;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2237039
  • Filename
    6423846
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=35283