Title :
Reduction of coercivity in FePt/FeRh bilayer films by heating
Author :
Koyama, S. ; Ogata, H. ; Konno, M. ; Goto, T. ; Koike, K.
Author_Institution :
Daido Electron. Co., Ltd., Gifu, Japan
Abstract :
In this study, in order to investigate the effect of antiferromagnetic(AF)-ferromagnetic(FM) transition of FeRh layer on the magnetization reversal of FePt layer, some films of FePt/FeRh/MgO(001) with different thickness are fabricated and the temperature dependence of polar Kerr effect are measured. In addition, details of film structure are investigated by XRD, AFM/MFM and RHEED measurements. Results show that for the FePt(10 nm)/FeRh (7.5 nm) film, the coercive field Hc decreases gradually with increasing temperature, but slightly increase once, and takes a small maximum around the AF-FM transition temperature(Tt). The slight increase of Hc around Tt may be due to a contribution of strain to the magnetic anisotropy of FePt, since the first order AF-FM transition of FeRh gives rise to sharp lattice expansion. On the other hand, for the FePt(10 nm)/FeRh(25 nm) film, the coercive field decreases drastically at temperature above Tt. A shape change in polar Kerr hysteresis loops is observed which suggests the existence of exchange spring effect between FeRh underlayer and FePt upperlayer.
Keywords :
X-ray diffraction; antiferromagnetic materials; atomic force microscopy; coercive force; ferromagnetic materials; ferromagnetic-antiferromagnetic transitions; heat treatment; interface magnetism; iron alloys; magnetic anisotropy; magnetic force microscopy; magnetic hysteresis; magnetic thin films; magnetic transition temperature; magnetisation reversal; platinum alloys; reflection high energy electron diffraction; rhodium alloys; 10 nm; 25 nm; 7.5 nm; AFM; FePt-FeRh; MFM; Mg; RHEED; XRD; antiferromagnetic-ferromagnetic transition; bilayer films; coercive field; exchange spring effect; film structure; heating; lattice expansion; magnetic anisotropy; magnetization reversal; polar Kerr hysteresis loops; transition temperature; Antiferromagnetic materials; Coercive force; Heating; Kerr effect; Magnetic field measurement; Magnetic films; Magnetization reversal; Temperature dependence; Thickness measurement; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1463554