Title :
High resolution digital elevation model and a Web-based client-server application for improved flood plain management
Author :
Sugumaran, Ramanthan ; Davis, Curt H. ; Meyer, Jim ; Prato, Tony
Author_Institution :
CARES, Missouri Univ., Columbia, MO, USA
Abstract :
Digital elevation models (DEMs) are used more and more frequently in flood plain management. Examples include flood plain models, visualization, flood hazard assessment, and determination of flood-plain elevation. One of the major problems in developing accurate high resolution DEMs is that traditional data sources do not possess enough horizontal resolution and vertical accuracy for flood-plain studies. In this study, a high-resolution DEM was generated using digitally scanned NAPP aerial photos in conjunction with highly accurate ground control from a rapid-static GPS survey. The high resolution DEM and an ortho-mosaic of the NAPP images developed in this study were made available to St. Charles County government officials through the World Wide Web using Client-Server technology. The design and development of this technology utilized ArcViewIMS, ArcView GIS, Java, JavaScript, HTML and Avenue programming. This Web-based tool allows the user to query a point in the ortho-mosaic to determine horizontal position and vertical elevation. In addition, common mapping functions such as zoom, pan, download and print are also incorporated in the Web-based tool
Keywords :
geographic information systems; geophysical techniques; geophysics computing; hydrological techniques; hydrology; topography (Earth); ArcView GIS; ArcViewIMS; Avenue programming; DEM; HTML; Java; JavaScript; Web-based client-server application; digital elevation model; elevation; flood hazard assessment; flood plain management; geophysics computing; high resolution; hydrology; land surface topography; ortho-mosaic; Data visualization; Digital elevation models; Floods; Geographic Information Systems; Global Positioning System; Hazards; Image resolution; Java; Local government; Web sites;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
DOI :
10.1109/IGARSS.2000.860510