• DocumentCode
    352865
  • Title

    Simulation and analysis for the microwave backscattering coefficient of rice

  • Author

    Ma, Hongbing ; Zeng, Qiming ; Zhang, Tao

  • Author_Institution
    Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    369
  • Abstract
    Based on the vector radiative transfer theory (VRT), a first-order microwave backscattering model for rice canopy is presented. The rice canopy is characterized as uniform layer containing leaves and stems, while the spike of rice is omitted. The probability distribution of the size and orientation of the leaves and stems of rice is obtained by the statistics of the field measurement. The model takes into account all the main physical processes, including the scattering and extinction of the leaves and stems in the rice canopy and the reflection of the underlying water. The backscattering coefficient of the rice canopy is calculated using the model. According to the simulation results, the variations of the rice backscattering coefficient with the time, incidence angle, wavelength and polarization are discussed. Some valuable quantitative results and practical conclusions are summarized
  • Keywords
    agriculture; backscatter; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; vegetation mapping; Oryza sativa; agriculture; backscatter; canopy; crops; first-order microwave backscattering model; geophysical measurement technique; microwave backscattering coefficient; radar remote sensing; radar scattering; rice; simulation; uniform layer; vector radiative transfer theory; vegetation mapping; Analytical models; Backscatter; Microwave theory and techniques; Optical scattering; Polarization; Probability distribution; Radar scattering; Reflection; Size measurement; Statistical distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.860522
  • Filename
    860522