• DocumentCode
    352890
  • Title

    Development of high-density interconnection techniques for contactless smart cards

  • Author

    Aintila, A. ; Sarkka, J. ; Kivilahti, J.K.

  • Author_Institution
    Picopak Oy., Lohja, Finland
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    55
  • Abstract
    Summary form only given. This paper deals with techniques that are used for fabricating high density and thin assemblies with emphasis on materials, implementation and reliability. Moreover, a new potential interconnection and packaging technique being particularly suitable for contacting ultra-thin chips is also introduced. In the production tests electroless fine-pitch Ni/Au bumped chips were bonded with solder paste but the results were not satisfactory. Commercial isotropically and anisotropically conductive adhesives allowing denser interconnections than conventional soldering gave markedly better results and are now used in volume production of contactless cards. A new type of ACA containing fusible filler particles was employed for bonding flip chip bumps on the substrate with metallurgically compatible contact pads. The results proved to be very promising especially from the electrical continuity point of view. A solderless interconnection technique, which is especially suitable for producing very fine pitch interconnections, was employed successfully for fabricating contactless smart cards. In this technique, in which the substrate conductors are chemically deposited on shallow bumps of the embedded chips, high reliability of the interconnections can be achieved
  • Keywords
    adhesives; fine-pitch technology; flip-chip devices; integrated circuit packaging; integrated circuit reliability; production testing; smart cards; anisotropically conductive adhesives; contactless smart cards; electrical continuity; electroless fine-pitch bumped chips; flip chip bumps; fusible filler particles; high-density interconnection techniques; isotropically conductive adhesives; packaging technique; production tests; reliability; substrate conductors; ultra-thin chips; volume production; Anisotropic magnetoresistance; Assembly; Bonding; Conducting materials; Contacts; Gold; Materials reliability; Packaging; Production; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
  • Conference_Location
    Espoo
  • Print_ISBN
    0-7803-6460-0
  • Type

    conf

  • DOI
    10.1109/ADHES.2000.860573
  • Filename
    860573