DocumentCode :
352892
Title :
Development of processing diagrams for underfill resins
Author :
Taweeplengsangsuke, J. ; Pearson, R.A.
Author_Institution :
Microelectron. Packaging Mater. Lab., Lehigh Univ., Bethlehem, PA, USA
fYear :
2000
fDate :
2000
Firstpage :
174
Lastpage :
181
Abstract :
Underfill resins are used to reduce the solder fatigue in flip-chip assemblies. Both the underfilling and the curing process are crucial to the reliability of the finished products. A variety of techniques have been used to characterize the essential phenomena governing the processing of underfill resins. Such phenomena include wetting, flow behavior, cure kinetics, cure stresses, outgassing phenomena and void formation. We will show that processing diagrams for underfill resins can be developed based on these fundamentals and provide guidelines for the underfilling and curing steps. With such processing diagrams one should be able to design the underfilling and curing process using a scientific approach that allows one to save time and money from the usual trial and error method
Keywords :
adhesion; encapsulation; fatigue; flip-chip devices; integrated circuit reliability; soldering; voids (solid); wetting; cure kinetics; cure stresses; flip-chip assemblies; flow behavior; outgassing phenomena; processing diagrams; reliability; solder fatigue; underfill resins; void formation; wetting; Assembly; Bonding; Channel spacing; Curing; Flip chip; Microelectronics; Packaging; Resins; Surface tension; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
Conference_Location :
Espoo
Print_ISBN :
0-7803-6460-0
Type :
conf
DOI :
10.1109/ADHES.2000.860594
Filename :
860594
Link To Document :
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