• DocumentCode
    3529012
  • Title

    Using first passage times to manage eco-system regime shifts

  • Author

    Tamba, Tua A. ; Lemmon, M.D.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • fYear
    2013
  • fDate
    10-13 Dec. 2013
  • Firstpage
    2697
  • Lastpage
    2702
  • Abstract
    Regime shifts refer to sudden changes in the structure or function of an eco-system due to external forces on the system. Such shifts arise because these systems have multiple equilibria so external disturbances may drive the state between different regions of attraction. Examples of such shifts include the shift in eutrophic state of shallow lakes in response to nutrient loading as well as the collapse of fisheries in response to the introduction of invasive species. A key measure of an ecosystem´s resilience to such shifts is measured by first passage times (FPT) between the basins of attraction for different equilibria. Prior work in eco-system management has assumed low-dimensional linearized models driven by Brownian motions. This paper uses sum-of-square (SOS) programs to bound FPT probabilities for more complex nonlinear population processes in which the primary disturbance is a Poisson jump process. The paper uses this approach to design management policies controlling the level of invasive species in lake systems.
  • Keywords
    Brownian motion; ecology; lakes; probability; stochastic processes; Brownian motion; FPT probability; Poisson jump process; SOS program; ecosystem management; ecosystem regime shift management; ecosystem resilience; eutrophic state shift; external disturbance; first passage time; fishery collapse; invasive species introduction; lake system; low-dimensional linearized model; management policies; nonlinear population process; nutrient loading; shallow lake; sum-of-square program; Diffusion processes; Generators; Lakes; Polynomials; Sociology; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control (CDC), 2013 IEEE 52nd Annual Conference on
  • Conference_Location
    Firenze
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-4673-5714-2
  • Type

    conf

  • DOI
    10.1109/CDC.2013.6760290
  • Filename
    6760290