Title :
CRÈME-MC: A physics-based single event effects tool
Author :
Sierawski, Brian D. ; Mendenhall, Marcus H. ; Weller, Robert A. ; Reed, Robert A. ; Adams, James H. ; Watts, John W. ; Barghouty, Abdulnasser F.
Author_Institution :
Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN, USA
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
The CRÈME suite of tools have been extensively used to predict the effects of cosmic rays on microelectronics in space. These tools only consider electronic stopping of ions and nuclear reactions from protons on silicon. Ion-ion physics and the inclusion of additional electronic materials are required to predict large energy deposition events. The successor to the rate prediction tools, CRÈME-MC, is a Geant4 based application intended to address the challenges associated with highly-scaled or radiation-hardened devices.
Keywords :
high energy physics instrumentation computing; ion beam effects; nuclear electronics; radiation monitoring; CREME tool suite; Geant4 application; cosmic rays; electronic ion stopping; electronic materials; energy deposition events; ion-ion physics; nuclear reactions; radiation-hardened devices; single event effects tool; Computational modeling; Integrated circuit modeling; Materials; Microelectronics; Monte Carlo methods; Single event upset; Solid modeling; CRÈME; Monte Carlo; rate prediction; single event upset;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873968
