• DocumentCode
    35293
  • Title

    Non-Monotonic \\gamma -Ray Influence on Mo/n-Si Schottky Barrier Structure Properties

  • Author

    Olikh, O.Y.

  • Author_Institution
    Fac. of Phys., Taras Shevchenko Kyiv Nat. Univ., Kyiv, Ukraine
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    394
  • Lastpage
    401
  • Abstract
    The current-voltage characteristics of Mo/n-Si Schottky barrier structure irradiated by γ-rays of 60Co were investigated in the temperature range of 120-330 K. The zero-bias barrier height, ideality factor, and reverse current were found to depend non-monotonously on the cumulative dose. The samples exposed to different radiation doses were found to display different forward current transport mechanism. In non-irradiated structure the current-transport mechanism is thermionic emission (TE) over inhomogeneous barrier. In the structure exposed to 10 kGy the mechanism is defect-assisted tunneling in the lower temperature range 120-220 K, and TE over inhomogeneous barrier in the higher temperature range 260-330 K. In the structure exposed to 100 kGy the mechanism is tunneling in the 150-220 K range, and TE (dominant) and tunneling at 260-330 K. The obtained results are explained by the increase of radiation defect concentrations (for comparatively small doses), and by further gettering of defects in the inhomogeneous regions as the irradiation dose increases.
  • Keywords
    Schottky barriers; radiation effects; thermionic emission; Schottky barrier structure properties; current transport mechanism; current voltage characteristics; defect assisted tunneling; ideality factor; inhomogeneous barrier; irradiation dose; nonirradiated structure; radiation defect concentration; reverse current; temperature 120 K to 330 K; thermionic emission; zero bias barrier height; Nonhomogeneous media; Schottky barriers; Temperature dependence; Temperature distribution; Temperature measurement; Tunneling; Dose rate effects; gamma-ray effects; semiconductor devices; silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2234137
  • Filename
    6423847