• DocumentCode
    3529461
  • Title

    Development of mammogram computer-aided diagnosis systems using optical processing technology

  • Author

    Lindell, Scott ; Shapiro, Gary ; Weil, Kenneth ; Flannery, David ; Levy, Jeffrey ; Qian, Wei

  • Author_Institution
    Lockheed Martin Astronaut., Denver, CO, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    173
  • Lastpage
    179
  • Abstract
    Mammogram computer-aided diagnosis (CAD) systems based on digital image processing algorithms are under development. These systems act as an aid to the radiologist, providing image cues of the locations of likely cancer lesions, and they have been shown to increase lesion detection performance. The use of state-of-the-art hybrid optical and digital processing technologies affords a reduction in processing time, and enables further improvements in sensitivity and specificity. Many CAD algorithm components can be mapped into linear filtering operations and implemented in a Fourier transform coherent optical processor. With the near-term promise of performing 512×512-sample convolutions at 1,000 frames-per-second rates, optical processors will greatly increase the CAD system speed. A test-bed hybrid optical/electronic processor is under development following the successful completion of studies that verified the feasibility of mapping algorithms into optically-implemented filtering operations
  • Keywords
    Fourier transform optics; cancer; diagnostic radiography; mammography; medical image processing; optical information processing; Fourier transform coherent optical processor; cancer lesions; digital image processing algorithms; hybrid optical/electronic processor; lesion detection; linear filtering operations; mammogram computer-aided diagnosis systems; optical processing technology; radiologist; sensitivity; specificity; Cancer detection; Computer aided diagnosis; Digital images; Filtering algorithms; Fourier transforms; Lesions; Maximum likelihood detection; Optical filters; Optical sensors; Sensitivity and specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Imagery Pattern Recognition Workshop, 2000. Proceedings. 29th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7695-0978-9
  • Type

    conf

  • DOI
    10.1109/AIPRW.2000.953622
  • Filename
    953622