Title :
An 8-bit, two-step embedded ADC for a SiPM read-out chip
Author :
Corsi, F. ; Marzocca, C. ; Matarrese, G. ; Foresta, M. ; Argentieri, A. ; Guerra, A. Del
Author_Institution :
DEE, Politec. di Bari, Bari, Italy
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
An 8-bit Analog-to-Digital Converter (ADC), suitable to be integrated in multi-channel ASICs for the read-out of SiPM arrays, has been designed in a standard 0.35mm CMOS process. The circuit implements two 8-bit interleaved ADCs with a two-step flash architecture. Each ADC has a sub-ranging mode of operation, and the overall frequency of conversion is of 20MHz. Clock boosting techniques have been exploited to improve the performance of the transmission gates used as switches and a pre-coarse conversion phase has been introduced to improve the conversion accuracy for signals close to the limits of the input dynamic range. Much care has been devoted to the design of the resistor ladder used to generate the voltage references for the comparators. In particular a statistical approach has been adopted to optimize the standard deviations of the voltage references due to resistor mismatch. A test chip containing a prototype of the ADC has been manufactured and the first characterization measurements are here presented and discussed.
Keywords :
analogue-digital conversion; application specific integrated circuits; nuclear electronics; photomultipliers; readout electronics; silicon radiation detectors; 8-bit analog-to-digital converter; ADC prototype; CMOS process; SiPM arrays; SiPM read-out chip; clock boosting techniques; conversion frequency; input dynamic range; multichannel ASIC; operation sub-ranging mode; pre-coarse conversion phase; resistor ladder design; resistor mismatch; test chip; transmission gate performance; two-step embedded ADC; two-step flash architecture; voltage references; Accuracy; Application specific integrated circuits; Clocks; Power supplies; Prototypes; Resistors; Switches;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873996