Test engineering education in Europe: the EuNICE-Test project

Author

Bertrand, Y. ; Flottes, M.L. ; Balado, L. ; Figueras, J. ; Biasizzo, A. ; Novak, F. ; Di Carlo, S. ; Prinetto, P. ; Pricopi, N. ; Wunderlich, H.-J. ; Van der Heyden, J.-P.

Author_Institution

Lab. d´´Informatique, Univ. of Montpellier, Montpiller, France

fYear

2003

fDate

1-2 June 2003

Firstpage

85

Lastpage

86

Abstract

The paper deals with a European experience of education in industrial test of ICs and SoCs using remote testing facilities. The project addresses the problem of the shortage in microelectronics engineers aware with the new challenge of testing mixed-signal SoCs far multimedia/telecom market. It aims at providing test training facilities at a European scale in both initial and continuing education contexts. This is done by allowing the academic and industrial partners of the consortium to train engineers using the common test resources center (CRTC) hosted by LIRMM (Laboratoire d´Informatique, de Robotique et de Microelectronique de Montpellier, France). CRTC test tools include up-to-date/high-tech testers that are fully representative of real industrial testers as used on production testfloors. At the end of the project, it is aimed at reaching a cruising speed of about 16 trainees per year per center. Each trainee will have attend at least one one-week training using the remote test facilities of CRTC.

Keywords

continuing education; engineering education; industrial training; integrated circuit testing; integrated circuits; system-on-chip; CRTC test tools; EuNICE test project; European network for initial and continuing education; France; IC test; SOC test; common test resources center; continuing education; high-tech testers; industrial partners; industrial test; integrated circuits; microelectronics engineers; mixed signal SOC; multimedia market; production testfloors; remote testing; system-on-chip; telecom market; test engineering education; training; up-to-date testers; Continuing education; Engineering education; Europe; Industrial training; Microelectronics; Production; Service robots; Telecommunications; Test facilities; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Systems Education, 2003. Proceedings. 2003 IEEE International Conference on

Print_ISBN

0-7695-1973-3

Type

conf

DOI

10.1109/MSE.2003.1205266

Filename

1205266