DocumentCode
3529939
Title
Terahertz bandwidth waveform spectrum analysis
Author
Pelusi, Mark ; Vo, Trung ; Eggleton, Benjamin
Author_Institution
Centre for Ultrahigh bandwidth Devices for Opt. Syst., Univ. of Sydney, Sydney, NSW, Australia
fYear
2010
fDate
5-9 Oct. 2010
Firstpage
381
Lastpage
384
Abstract
We review the recent demonstrations of the waveform power spectrum (WPS) analysis of high-speed optical signals based on using the ultra-fast Kerr effect in an optical medium. Experiments with highly nonlinear planar waveguides have highlighted the technique´s capability to achieve a multi-terahertz measurement bandwidth that far surpasses the limits of electronics by over an order of magnitude. This has enabled the WPS measurement of pulses as short as 260 fs, and for signals with bit-rates as high as 1.28 Tb/s. Furthermore, the broadband WPS of high bit-rate signals has been effectively used to retrieve the signal autocorrelation waveform via an inverse Fourier Transform operation. This in turn has provided a novel approach for characterizing the signal in terms of quantifying distortions such as dispersion, timing jitter and noise. The critical design features of the nonlinear waveguide for application to short pulses and high-speed signals are discussed.
Keywords
Fourier transform optics; high-speed optical techniques; microwave photonics; optical Kerr effect; optical dispersion; optical distortion; optical noise; optical planar waveguides; optical variables measurement; timing jitter; waveform analysis; bit-rate signals; high-speed optical signals; inverse Fourier Transform operation; multiterahertz measurement bandwidth; nonlinear planar waveguides; optical dispersion; optical distortion; optical medium; optical noise; signal autocorrelation waveform; terahertz bandwidth waveform power spectrum; timing jitter; ultrafast Kerr effect; Correlation; Nonlinear optics; Optical fibers; Optical pulses; Optical variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Photonics (MWP), 2010 IEEE Topical Meeting on
Conference_Location
Montreal, QC
Print_ISBN
978-1-4244-7824-8
Type
conf
DOI
10.1109/MWP.2010.5664126
Filename
5664126
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