DocumentCode
3530075
Title
VIPIC IC — Design and test aspects of the 3D pixel chip
Author
Deptuch, G.W. ; Trimpl, M. ; Yarema, R. ; Siddons, D.P. ; Carini, G. ; Grybos, P. ; Szczygiel, R. ; Kachel, M. ; Kmon, P. ; Maj, P.
Author_Institution
Electr. Eng. Dept., Fermi Nat. Accel. Lab., Batavia, IL, USA
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
1540
Lastpage
1543
Abstract
We report on the design of the VIPIC IC (Vertically Integrated Pixel Imaging Chip) designed for X-ray Photon Correlation Spectroscopy (XPCS) experiments by FNAL in collaboration with AGH-UST. The VIPIC chip is a prototype matrix with 64 × 64 pixels with 80 μm × 80 μm pixel size and consists of two layers: analog and digital. The single analog pixel cell consists of a charge sensitive amplifier, a shaper, a single current discriminator and trim DACs. The simulated gain is 52 μV/e-, the noise ENC <; 150 e- rms (with Cdet= 100 fF) and the peaking time tp <; 250 ns. The power consumption is 25 μW/pixel in the analog part. The digital layer of the VIPIC integrated circuit is divided into 16 readout groups of pixels read out in parallel via separate serial ports with nominal frequency of the 100 MHz clock using the LVDS standard. The readout within each group is zero-suppressed. The sparsification scheme (addresses of hit pixels only) allows a dead-time free readout.
Keywords
integrated optoelectronics; optical correlation; photon correlation spectroscopy; readout electronics; 3D pixel chip; AGH-UST; FNAL experiment; VIPIC IC; Vertically Integrated Pixel Imaging Chip; X-ray Photon Correlation Spectroscopy; charge sensitive amplifier; prototype matrix; shaper; single current discriminator; Computer architecture; Detectors; Integrated circuits; Metals; Photonics; Pixel; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874034
Filename
5874034
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