Title :
Remaining problems in the combined XPS/UPS/FES system
Author :
Yamaguchi, H. ; Nozue, S. ; Muraoka, R. ; Kudo, Y. ; Masuzawa, T. ; Yamada, T. ; Kudo, M. ; Takakuwa, Y. ; Chun, W.J. ; Okano, K.
Author_Institution :
Dept. of Mater. Sci. & Eng., Rutgers Univ., New Brunswick, NJ, USA
Abstract :
The study aims to investigate the energy band diagram of emitting diamond using the electron energy distribution obtained from combined X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, and field emission spectroscopy. Combination of UPS and FES can determine the origin of electron field emission relative to the electronic structure of diamond. By adding XPS, the origin of field-emitted electrons can further be related to the surface termination, which is known to greatly affect the emission properties.
Keywords :
X-ray photoelectron spectra; diamond; electron field emission; energy gap; ultraviolet photoelectron spectra; C; UPS; X-ray photoelectron spectroscopy; XPS; diamond; electron energy distribution; electron field emission; electronic structure; energy band diagram; field emission spectroscopy; surface termination; ultraviolet photoelectron spectroscopy; Apertures; Area measurement; Electron emission; Electron guns; Materials science and technology; Position measurement; Signal resolution; Spectroscopy; Thermal conductivity; Uninterruptible power systems;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
DOI :
10.1109/IVNC.2009.5271836
