DocumentCode :
3530222
Title :
Dynamic forward body bias enhanced tri-mode MTCMOS
Author :
Jiao, Hailong ; Kursun, Volkan
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear :
2010
fDate :
3-4 Aug. 2010
Firstpage :
33
Lastpage :
37
Abstract :
Ground bouncing noise produced during reactivation events is an exacerbating challenge to maintain accurate logic levels in Multi-threshold CMOS (MTCMOS) circuits. A new noise-aware MTCMOS circuit with dynamic forward body bias is explored in this paper to minimize the ground bouncing noise with smaller sleep transistors. The dynamic-forward-body-biased MTCMOS circuit lowers the peak ground bouncing noise by up to 27.76% while reducing the size of the additional sleep transistor by 85.71% as compared to the previously published noise-aware MTCMOS techniques with standard zero-body-biased high threshold voltage sleep transistors. Furthermore, the proposed forward body bias circuit technique achieves up to 14.67% noise reduction and 70% sleep transistor downsizing as compared to a previously published forward-body-biased tri-mode MTCMOS circuit technique. The design tradeoffs between ground bouncing noise and leakage power consumption are evaluated for various MTCMOS circuits in a UMC 80 nm CMOS technology.
Keywords :
CMOS integrated circuits; circuit noise; transistor circuits; CMOS technology; forward body bias; ground bouncing noise; multi-threshold CMOS circuits; reactivation events; sleep transistors; tri-mode MTCMOS circuits; Active circuits; Active noise reduction; CMOS logic circuits; CMOS technology; Circuit noise; Energy consumption; Integrated circuit noise; Noise reduction; Subthreshold current; Threshold voltage; SLEEP to ACTIVE mode transition; dominant noise component; leakage power consumption; optimum transistor size; threshold voltage tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4244-7809-5
Type :
conf
DOI :
10.1109/ASQED.2010.5548161
Filename :
5548161
Link To Document :
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