DocumentCode :
3530261
Title :
Comparison of different annealing gases effects on the optical emission properties of zinc oxide thin films deposited by radio frequency sputtering
Author :
Li, Chaoyang ; Matsuda, Tokiyoshi ; Nakanishi, Yoichiro ; Ichinomiya, Keiji ; Furuta, Mamoru ; Hiramatsu, Takahiro ; Furuta, Hiroshi ; Kawaharamura, Toshiyuki ; Hirao, Takashi
Author_Institution :
Res. Inst. for Nano-device, Kochi Univ. of Technol., Kami, Japan
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
63
Lastpage :
64
Abstract :
Recent several years, ZnO thin film has attracted much more attention due to its promising electrical, optical and piezoelectric properties, which can be extensive apply in electronic and optoelectronic fields such as optical waveguides, solar cell, gas sensors, etc. Especially, ZnO is a wide-band gap of 3.37 eV and high efficiency as a low-voltage cathodoluminescent phosphor material in backlight for field emission display. Among the many fabrication techniques of ZnO film, magnetron radio frequency sputtering is considered as a convenient method to deposition homogeneous ZnO thin film on large area. In this research, we will compare the phosphor properties of ZnO film by post-thermal treatment in different gas ambient.
Keywords :
II-VI semiconductors; annealing; field emission; phosphors; photoluminescence; semiconductor thin films; sputtering; wide band gap semiconductors; zinc compounds; ZnO; annealing gas effects; field emission display; low-voltage cathodoluminescent phosphor material; magnetron radiofrequency sputtering; optical emission properties; post-thermal treatment; wide-band gap semiconductor; zinc oxide thin films; Annealing; Gases; Optical films; Optical sensors; Optical waveguides; Piezoelectric films; Radio frequency; Sputtering; Stimulated emission; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
Type :
conf
DOI :
10.1109/IVNC.2009.5271839
Filename :
5271839
Link To Document :
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