• DocumentCode
    3530261
  • Title

    Comparison of different annealing gases effects on the optical emission properties of zinc oxide thin films deposited by radio frequency sputtering

  • Author

    Li, Chaoyang ; Matsuda, Tokiyoshi ; Nakanishi, Yoichiro ; Ichinomiya, Keiji ; Furuta, Mamoru ; Hiramatsu, Takahiro ; Furuta, Hiroshi ; Kawaharamura, Toshiyuki ; Hirao, Takashi

  • Author_Institution
    Res. Inst. for Nano-device, Kochi Univ. of Technol., Kami, Japan
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    63
  • Lastpage
    64
  • Abstract
    Recent several years, ZnO thin film has attracted much more attention due to its promising electrical, optical and piezoelectric properties, which can be extensive apply in electronic and optoelectronic fields such as optical waveguides, solar cell, gas sensors, etc. Especially, ZnO is a wide-band gap of 3.37 eV and high efficiency as a low-voltage cathodoluminescent phosphor material in backlight for field emission display. Among the many fabrication techniques of ZnO film, magnetron radio frequency sputtering is considered as a convenient method to deposition homogeneous ZnO thin film on large area. In this research, we will compare the phosphor properties of ZnO film by post-thermal treatment in different gas ambient.
  • Keywords
    II-VI semiconductors; annealing; field emission; phosphors; photoluminescence; semiconductor thin films; sputtering; wide band gap semiconductors; zinc compounds; ZnO; annealing gas effects; field emission display; low-voltage cathodoluminescent phosphor material; magnetron radiofrequency sputtering; optical emission properties; post-thermal treatment; wide-band gap semiconductor; zinc oxide thin films; Annealing; Gases; Optical films; Optical sensors; Optical waveguides; Piezoelectric films; Radio frequency; Sputtering; Stimulated emission; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271839
  • Filename
    5271839