• DocumentCode
    3530358
  • Title

    Front-end ASIC for a liquid argon TPC

  • Author

    De Geronimo, Gianluigi ; D´Andragora, Alessio ; Li, Shaorui ; Nambiar, Neena ; Rescia, Sergio ; Vernon, Emerson ; Chen, Hucheng ; Lanni, Francesco ; Makowiecki, Don ; Radeka, Veljko ; Thorn, Craig ; Yu, Bo

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    1658
  • Lastpage
    1666
  • Abstract
    We introduce a front-end application specific integrated circuit (ASIC) for a wire based Time-Projection-Chamber (TPC) operating in liquid Argon (LAr). The LAr TPC will be used for long baseline neutrino oscillation experiments. The ASIC must provide low-noise readout of the signals induced on the TPC wires, digitization of those signals at 2 MS/s, compression, buffering and multiplexing. A resolution better than 1000 rms electrons at 200 pF input capacitance for an input range of 300 fC is required, along with low power and operation in LAr (at 87 K). We present the characterization of a commercial technology for operation in cryogenic environment and the first experimental results on the analog front-end. The results demonstrate that CMOS transistors have lower noise and much improved dc characteristics at LAr temperature. Finally, we introduce the concept of “1/f equivalent” to model the low-frequency component of the noise spectral density, for use in the input MOSFET optimization.
  • Keywords
    1/f noise; MOSFET; application specific integrated circuits; neutrino detection; time projection chambers; 1/f equivalent; CMOS transistors; TPC wires; buffering; compression; cryogenic environment; front-end ASIC; front-end application specific integrated circuit; input MOSFET optimization; liquid argon TPC; long baseline neutrino oscillation experiments; low-noise readout; multiplexing; noise spectral density; signal digitization; wire based time-projection-chamber; Application specific integrated circuits; Current density; Density measurement; MOS devices; Noise; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874057
  • Filename
    5874057