Title :
MOVPE growth and characterization of long-wavelength emitting quantum dots based lasers at 300 K
Author :
Saint-Girons, G. ; Garnache, A. ; Patriarche, G. ; Sagnes, I.
Author_Institution :
Lab. de Photonique et de Nanostructures, CNRS, Marcoussis, France
Abstract :
We observed laser operation at 300 K on the 1st excited transition of a Low-Pressure Metalorganic Vapor Phase Epitaxy grown long wavelength emitting quantum dots array inserted in an edge emitting structure, at 1.14 μm for a cavity length of 495 μm. The guiding structure presents very low absorption losses (αi = 1.5 cm-1). The threshold current density was estimated to be around 1200 A.cm-2. Due to injection problems in that particular structure, we could not observe laser operation for cavity length larger than 500 μm, but we estimated that by lengthening the cavity to about 1.1 mm, laser operation should be observed at 1.25 μm, on the ground transition of the quantum dots. Laser operation is observed simultaneously on the 1st excited transition of the quantum dots and on the wetting layer, at 1.14 and 0.97 μm respectively. We attributed this phenomenon to an inefficient diffusion of the charge carriers in the wetting layer, probably related to the presence of point defects.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; laser cavity resonators; quantum dot lasers; semiconductor device measurement; semiconductor quantum dots; 0.97 micron; 1.1 mm; 1.14 micron; 300 K; 495 micron; 500 micron; InGaAs-GaAs; MOVPE; cavity length; ground transition; long-wavelength emitting quantum dot lasers; point defects; Absorption; Charge carriers; Epitaxial growth; Epitaxial layers; Laser excitation; Laser transitions; Optical arrays; Phased arrays; Quantum dot lasers; Threshold current;
Conference_Titel :
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN :
0-7803-7704-4
DOI :
10.1109/ICIPRM.2003.1205318