DocumentCode
3530573
Title
Development of a simulation tool to predict the behavior of a SiPM detector coupled to a scintillation crystal
Author
Liksonov, Dmitriy ; Barbier, Bruno ; Chavanelle, Jérôme
Author_Institution
ImaCisio Co., Besançon, France
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
1747
Lastpage
1751
Abstract
The present paper focuses on the development of the SimPET simulation tool intended for the estimation of the solidstate photons detector (Silicon Photomultiplier, SiPM, or Multi-Pixel Photon Counter, MPPC) and front-end electronics responses to scintillations generated in LYSO crystals of a PET scanner. The SimPET simulation software is presented, including the description of methods and algorithms used to simulate the photon generation, propagation, impact photon-SiPM, and the behavior of each pixel in the photon detector following this impact. The saturation effects caused by the dead time after each avalanche were taken into consideration, as well as the interdependence between SiPM pixels. The resulting output current vs. time curves obtained by simulation are then presented and compared with the ones obtained experimentally, indicating good agreement. The simulation models of frond-end electronics, including filters, ADCs, and digital signal processing unit are also presented. Finally, the simulation results are discussed in terms of their impact on the energy and position measurement resolution.
Keywords
high energy physics instrumentation computing; nuclear electronics; photomultipliers; readout electronics; silicon radiation detectors; solid scintillation detectors; SiPM detector; SimPET simulation software; SimPET simulation tool; frond-end electronics; impact photon-SiPM; multipixel photon counter; photon generation; photon propagation; scintillation crystal; silicon photomultiplier; solid-state photons detector; Brain modeling; Crystals; Detectors; Digital signal processing; Photonics; Pixel; Positron emission tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874073
Filename
5874073
Link To Document