Title :
Electromagnetic modeling of SPP resonance for low noise RF magnitude modulation of optical carriers
Author :
Tripon-Canseliet, C. ; Faci, S. ; Stolz, A. ; Dogheche, E. ; Decoster, D. ; Loiseaux, B. ; Delboulbe, A. ; Huignard, J.P. ; Chazelas, J.
Author_Institution :
Electron. & Electromagn. Lab., UPMC Univ Paris 06, Paris, France
Abstract :
In this paper, light modulation efficiency using surface plasmon polariton (SPP) excitation in metal/electro-optic material interface is investigated by electromagnetic simulations. The propagation constant of the plasmon wave are controlled by an electric field applied across the electro-optic layer and thus modulates in magnitude the reflected light.
Keywords :
electro-optical modulation; light propagation; light reflection; optical noise; polaritons; surface plasmon resonance; SPP resonance; electromagnetic modeling; light modulation efficiency; light reflection; low noise RF magnitude modulation; metal-electro-optic material interface; optical carriers; plasmon wave; propagation constant; surface plasmon polariton excitation; Modulation; Optical films; Optical reflection; Optical surface waves; Reflectivity; Refractive index;
Conference_Titel :
Microwave Photonics (MWP), 2010 IEEE Topical Meeting on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-7824-8
DOI :
10.1109/MWP.2010.5664194
