DocumentCode :
3531208
Title :
A systems approach to verification using hardware acceleration
Author :
Kumar, Sharad ; Shanbhag, Sainath ; Mongia, Mohit ; Verma, Gaurav
Author_Institution :
Freescale Semicond. Pvt. Ltd., Noida, India
fYear :
2010
fDate :
3-4 Aug. 2010
Firstpage :
189
Lastpage :
193
Abstract :
The increasing complexity of system-on-chip devices has made verification of these devices an extremely difficult task. Additionally, there is the pressure of time-to-market that is faced by all semiconductor companies. Some of the functional complexity of such devices has made it necessary to run system level sequences that were typically run only in post-silicon phase in the pre-silicon stages. However, the effective speeds of simulators used during functional verification do not lend well to running system level tests. In this paper we will describe how a hardware accelerator was used to execute system level tests. We will share some of the results seen and some of the design issues that were detected using such an approach. We have illustrated this approach choosing three distinct areas of (i) secure boot, (ii) built-in-self-test sequences, and (iii) scan testing. We also believe that going to a system level approach using hardware acceleration helps to find several difficult corner case issues that remain undetected using other verification approaches.
Keywords :
built-in self test; system-on-chip; boot security; built-in-self-test sequences; functional complexity; functional verification; hardware acceleration; post-silicon phase; pre-silicon stages; scan testing; semiconductor company; system level approach; system level sequences; system-on-chip devices; Acceleration; Built-in self-test; Computer bugs; Hardware; Logic programming; Palladium; Silicon; Software debugging; System testing; System-on-a-chip; Emulation; Hardware acceleration; Verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4244-7809-5
Type :
conf
DOI :
10.1109/ASQED.2010.5548241
Filename :
5548241
Link To Document :
بازگشت