Title :
Preliminary study on (CoPtCr/NiFe)-SiO2 hard/soft-stacked perpendicular recording media
Author :
Inaba, Y. ; Shimatsu, T. ; Kitakami, O. ; Sato, Hikaru ; Oikawa, T. ; Muraoka, H. ; Aoi, H. ; Nakamura, Y.
Author_Institution :
Tohoku Univ., Sendai, Japan
Abstract :
In this study, magnetization reversal mechanism of (NiFe/CoPtCr)-SiO2 hard/soft stacked media deposited on glass disks by co-sputtering method is examined, and the advantage of hard/soft structure is discussed compared to CoPtCr-SiO2 media. The thickness of these layers were set to be smaller than coherent length of magnetization; the thickness of CoPtCr-SiO2 layer was fixed at 10 nm and that of NiFe-SiO2 layer varied from 0 to 4 nm. Grain sizes of NiFe/CoPtCt were also studied by transmission electron microscopy (TEM).
Keywords :
chromium alloys; cobalt alloys; grain boundaries; grain size; iron alloys; magnetisation reversal; nickel alloys; perpendicular magnetic recording; platinum alloys; transmission electron microscopy; 0 to 4 nm; 10 nm; CoPtCr; NiFe; SiO2; TEM; co-sputtering method; glass disks; grain sizes; hard/soft stacked perpendicular recording media; hard/soft structure; magnetization reversal mechanism; Coercive force; Couplings; Grain boundaries; Magnetic switching; Magnetization reversal; Perpendicular magnetic recording; Remanence; Signal to noise ratio; Stacking; Thermal stability;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1463724
