مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3531433

Title :

Preface

fYear :

2009

fDate :

28-29 April 2009

Firstpage :

Lastpage :

Abstract :

Presents the welcome message from the conference proceedings.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on

Conference_Location :

Chengdu

Print_ISBN :

978-1-4244-2587-7

Type :

conf

DOI :

10.1109/CAS-ICTD.2009.4960735

Filename :

4960735

Link To Document :