DocumentCode
3531433
Title
Preface
fYear
2009
fDate
28-29 April 2009
Firstpage
3
Lastpage
3
Abstract
Presents the welcome message from the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960735
Filename
4960735
Link To Document