• DocumentCode
    3531455
  • Title

    Low-dose CT in SPECT/CT patient scan

  • Author

    Bian, Junguo ; Han, Xiao ; Wang, Jiong ; Sidky, Emil Y. ; Shao, Lingxiong ; Pan, Xiaochuan

  • Author_Institution
    Depts. of Radiol., Univ. of Chicago, Chicago, IL, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    2042
  • Lastpage
    2045
  • Abstract
    Advanced single-photon emission computed tomography (SPECT) includes a cone-beam computed tomography (CBCT) unit for acquisition of anatomic information about the imaged subject. CT images obtained can be used for attenuation correction in SPECT and localization determination. Hardware considerations have led to the use of an imaging configuration in which the CBCT field of view (FOV) is extended through the use of an offset detector. In general, current clinical CBCT applications involve data acquired at a large number of views. Therefore, the accumulated radiation dose integrated over a large number of views can be of a health concern. In this work, we report our preliminary investigation of image reconstruction by using the recently developed adaptive steepest descent-projection onto convex sets (ASD-POCS) algorithm from real patient data collected at a number of views much fewer than what are used currently in CBCT imaging in clinical SPECT/CT studies.
  • Keywords
    dosimetry; image reconstruction; medical image processing; single photon emission computed tomography; CT imaging; SPECT-CT patient scan; accumulated radiation dose integration; adaptive steepest descent-projection; advanced single-photon emission computed tomography; attenuation correction; cone-beam computed tomography unit; convex set algorithm; image reconstruction; imaging configuration; localization determination; low-dose CT; real patient data; Computed tomography; Detectors; Image reconstruction; Measurement; Pixel; Variable speed drives;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874135
  • Filename
    5874135