Title :
A HW/SW Co-Verification Technique for Field Programmable Gate Array (FPGA) Test
Author :
Liao, Y.B. ; Li, P. ; Ruan, A.W. ; Wang, Y.W. ; Li, W.C.
Author_Institution :
State key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
Field programmable gate arrays (FPGAs) have wide and extensive applications in many areas. Due to programmable feature of FPGAs, faults of FPGAs can be easily tolerated if fault sites can be located. A hardware/software (HW/SW) co- verification technique for FPGA test is proposed and presented in the paper. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, this technique is capable of testing each input/output block (IOB) and configurable logic block (CLB) of FPGA automatically, exhaustively and repeatedly. Fault cells of FPGA can be positioned automatically by the proposed approach. As a result, test efficiency and reliability can be enhanced without manual work.
Keywords :
field programmable gate arrays; hardware-software codesign; logic testing; FPGA; HW/SW coverification technique; configurable logic block; field programmable gate array; hardware-software technique; input-output block; Application specific integrated circuits; Circuit faults; Circuit testing; Field programmable gate arrays; Hardware; Logic testing; Routing; Software testing; System testing; Transmission line matrix methods;
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
DOI :
10.1109/CAS-ICTD.2009.4960748