• DocumentCode
    3531691
  • Title

    A Method on Analog Circuit Fault Diagnosis with Tolerance

  • Author

    Li, Yanjun ; Wang, Houjun ; Liu, Rueywen

  • Author_Institution
    Coll. of Autom., Univ. of Electron. Sci. & Technol. of China, Chengdu
  • fYear
    2009
  • fDate
    28-29 April 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this paper, it is proved that the direction of the node-voltage difference vector, which is the difference between the node-voltage vector at faulty state and the one at the nominal state, is determined only by the location of the faulty element in linear analog circuits. Considering that the direction of the node-voltage sensitivity vector is the same as the one of the node-voltage difference vector and also considering that the module of the node-voltage sensitivity vector can present the weight from the faulty element parameter deviation to the voltage difference, fault dictionary is made up of node-voltage sensitivity vectors. A decision algorithm is proposed concerned with both the location and the parameter difference of the faulty element. Single fault and multi-fault can be diagnosed while the circuit parameters deviate within the tolerance range of 10%.
  • Keywords
    analogue circuits; circuit reliability; fault diagnosis; fault tolerance; analog circuit fault diagnosis; analog circuit fault tolerance; node-voltage difference vector; node-voltage sensitivity vector; Analog circuits; Automation; Circuit faults; Circuit testing; Dictionaries; Educational institutions; Fault diagnosis; Joining processes; Vectors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-2587-7
  • Type

    conf

  • DOI
    10.1109/CAS-ICTD.2009.4960755
  • Filename
    4960755