DocumentCode :
3531782
Title :
Effect of deposition method on the density of InAs/InGaAs quantum dot
Author :
Chang, Fu-Yu ; Wu, T.C. ; Lin, Hao-Hsiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
452
Lastpage :
455
Abstract :
InAs self-organized quantum dots covered with In0.33Ga0.67As layer have been grown on GaAs substrates by gas-source molecular beam epitaxy. With three different deposition methods for growing the InGaAs capping layer, the quantum-dot density can be controllably changed from 2.3×1010 to 1.7×1011 cm-2. Photoluminescence at 1,318nm of quantum dots with the dot density as high as 7.6×1010 cm-2 can be achieved by sub-monolayer deposition (SMD) capping method. As-cleaved 3.98-mm-long laser diode using triple stacks of InAs/InGaAs quantum dots with SMD method demonstrates a lasing wavelength of 1,305nm and a threshold current density of 360A/cm2. The ground-state saturation gain of 16.6cm-1 is achieved due to the high dot density.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; photoluminescence; quantum dot lasers; self-assembly; semiconductor device measurement; semiconductor quantum dots; 1305 nm; 1318 nm; 3.98 mm; GaAs; InAs-InGaAs; InAs/InGaAs quantum dot; deposition method effect; gas-source molecular beam epitaxy; ground-state saturation gain; laser diode; photoluminescence; quantum-dot density; self-organized quantum dots; sub-monolayer deposition capping method; Gallium arsenide; Indium gallium arsenide; Land surface temperature; Molecular beam epitaxial growth; Optical buffering; Quantum dot lasers; Quantum dots; Stimulated emission; Substrates; US Department of Transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN :
0-7803-7704-4
Type :
conf
DOI :
10.1109/ICIPRM.2003.1205414
Filename :
1205414
Link To Document :
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