• DocumentCode
    3531806
  • Title

    Efficient Online RTL Debugging Methodology for Logic Emulation Systems

  • Author

    Banerjee, Somnath ; Gupta, Tushar

  • Author_Institution
    Mentor Graphics India Pvt. Ltd., Noida, India
  • fYear
    2012
  • fDate
    7-11 Jan. 2012
  • Firstpage
    298
  • Lastpage
    303
  • Abstract
    The offline debugging model provided by logic emulation systems has some specific disadvantages. Since analysis of signal traces and bug fixing is decoupled from emulation run, validation of a potential fix requires a costly iteration through design recompilation and mapping process, followed by fresh emulation run. This slows down overall verification process. This paper presents an online debugging methodology to achieve rapid verification closure with capability to execute the design back and forward for debug. On encountering an error, the design under test (DUT) can be reverse executed step-by-step to locate source of the error. A two pass emulation technique is used to generate checkpoints and traces needed to support reverse execution. Easy and efficient reverse execution based debug is supported using an innovative technique called optimized design slicing, which allows debug along a meaningful design portion likely to cause the error being investigated. Once the source of error is located, potential bug fixes can be evaluated online by forcing a set of signals to desired values, without going through the design recompilation process and restarting emulation from time 0. Benchmarks on several customer designs have shown that the methodology enhances verification performance significantly.
  • Keywords
    integrated circuit modelling; iterative methods; logic circuits; DUT; costly iteration through design recompilation; design under test; logic emulation systems; mapping process; online RTL debugging methodology; online debugging methodology; optimized design slicing; two pass emulation technique; Clocks; Debugging; Emulation; Force; Hardware design languages; Logic gates; Software; Debugging; Emulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design (VLSID), 2012 25th International Conference on
  • Conference_Location
    Hyderabad
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-4673-0438-2
  • Type

    conf

  • DOI
    10.1109/VLSID.2012.87
  • Filename
    6167768