DocumentCode
3531820
Title
Scatter fraction performance tests for positron imaging system with dual plane geometry
Author
Ni, Yu-Ching ; Tsai, Tien-Hsiu ; Jan, Meei-Ling ; Lin, Zhi-Kun ; Tseng, Fan-Pin ; Hsu, Shiang-Lin
Author_Institution
Inst. of Nucl. Energy Res., LongTan, Taiwan
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
2163
Lastpage
2165
Abstract
NEMA NU 2 and IEC 61675-1 standards are widely used for characterizing the performance of PET scanners. These documents specify procedures for acquiring and analyzing data by using standard phantoms and radio-sources. However, some dedicated PET systems, such as breast and prostate PET systems, have non-ring geometric design may not meet these standards. In this work, we proposed certain modifications to the NEMA NU 2 for analyzing the scatter fraction (SF) of a dual-plane positron imaging system reasonably. A projection-map with geometric compensation was performed instead of sinogram to get analyzed profile. Three methods to determine analyzed window (4 × FWHM, 40 mm width, and 14 mm width) were used to estimate SF. The effects of diameter and location of line source were also considered. Three diameters (0.6, 2, 3.2 mm) and nine locations of line source were set for GATE simulation. The equivalent SF of the dual-plane system was calculated as the area-weighted average of nine-position SF values. The results reveal that the presented method here can estimate SF value better, compared with the methods suggested by the standards.
Keywords
IEC standards; performance evaluation; phantoms; positron emission tomography; GATE simulation; IEC 61675-1 standard; NEMA NU 2 standard; PET; area-weighted average; breast; dual plane geometry; dual-plane positron imaging system; geometric compensation; line source; prostate; scatter fraction; sinogram; size 0.6 mm; size 14 mm; size 2 mm; size 3.2 mm; size 40 mm; Estimation; IEC standards; Phantoms; Positron emission tomography; Positrons;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874164
Filename
5874164
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