• DocumentCode
    3531823
  • Title

    A Novel Hierarchical-Detection Testability Modeling Methodology

  • Author

    Wang Dong ; Wang Yuefang ; Zheng Weidong ; Chen Shengjian

  • Author_Institution
    China Astronaut Res. & Training Center, Beijing
  • fYear
    2009
  • fDate
    28-29 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a comprehensive hierarchical-detection methodology for testability modeling is presented. At the beginning, interconnect test could be performed using boundary scan technology, then, general failure and functional failure could be detected and distinguished with multi-output of test indication, and lastly, two F-T matrix are built respectively, for F-failure and G-failure. By the examination and analysis, the modeling could lead the design for testability based on boundary scan and reduce fault ambiguities at a maximal degree.
  • Keywords
    boundary scan testing; design for testability; failure analysis; flow graphs; F-T matrix; F-failure; G-failure; boundary scan technology; comprehensive hierarchical detection; fault ambiguities; functional failure; general failure; hierarchical-detection testability modeling; interconnect test; Bridge circuits; Circuit faults; Design engineering; Design for testability; Extraterrestrial measurements; Fault detection; Flow graphs; Integrated circuit interconnections; Signal processing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-2587-7
  • Type

    conf

  • DOI
    10.1109/CAS-ICTD.2009.4960761
  • Filename
    4960761