DocumentCode
3531823
Title
A Novel Hierarchical-Detection Testability Modeling Methodology
Author
Wang Dong ; Wang Yuefang ; Zheng Weidong ; Chen Shengjian
Author_Institution
China Astronaut Res. & Training Center, Beijing
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
4
Abstract
In this paper, a comprehensive hierarchical-detection methodology for testability modeling is presented. At the beginning, interconnect test could be performed using boundary scan technology, then, general failure and functional failure could be detected and distinguished with multi-output of test indication, and lastly, two F-T matrix are built respectively, for F-failure and G-failure. By the examination and analysis, the modeling could lead the design for testability based on boundary scan and reduce fault ambiguities at a maximal degree.
Keywords
boundary scan testing; design for testability; failure analysis; flow graphs; F-T matrix; F-failure; G-failure; boundary scan technology; comprehensive hierarchical detection; fault ambiguities; functional failure; general failure; hierarchical-detection testability modeling; interconnect test; Bridge circuits; Circuit faults; Design engineering; Design for testability; Extraterrestrial measurements; Fault detection; Flow graphs; Integrated circuit interconnections; Signal processing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960761
Filename
4960761
Link To Document