Title :
Structure selection in synthetic aperture radar scattering models
Author :
Akyildiz, I. ; Moses, R.L.
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Abstract :
High-frequency models for radar backscatter can include components with different structures that correspond to different physical scattering mechanisms on an object. We consider the problem of structure selection for an attributed scattering center model that includes both localized and distributed scattering terms. We propose three structure classification algorithms, and compare their performance. We show that a threshold test on the estimated length parameter performs as well as a GLRT test, but is computationally more efficient. A computationally fast image-based test is shown to perform as well as the GLRT and length-based tests for scattering center lengths greater than twice the crossrange resolution of the measurements
Keywords :
electromagnetic wave scattering; image classification; image resolution; radar detection; radar imaging; radar resolution; synthetic aperture radar; GLRT test; HF models; SAR scattering models; computationally fast image-based test; crossrange resolution; distributed scattering; estimated length parameter; high-frequency models; length-based tests; localized scattering; measurements; performance comparison; physical scattering mechanisms; scattering center model; structure classification algorithms; structure detection; structure selection; synthetic aperture radar scattering models; threshold test; Backscatter; Electromagnetic scattering; Frequency; Image segmentation; Parameter estimation; Performance evaluation; Radar scattering; Scattering parameters; Synthetic aperture radar; Testing;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 2000. ICASSP '00. Proceedings. 2000 IEEE International Conference on
Conference_Location :
Istanbul
Print_ISBN :
0-7803-6293-4
DOI :
10.1109/ICASSP.2000.861171