DocumentCode :
3531859
Title :
[Copyright notice]
fYear :
2003
fDate :
21-25 Sept. 2003
Firstpage :
1
Lastpage :
1
Abstract :
The following topics are dealt with: advanced power clamps; on-chip protection; MOSFET; CMOS technologies; ESD testing; RFIC; photomask; and magnetic recording.
Keywords :
CMOS integrated circuits; MOSFET; clamps; electrostatic discharge; magnetic recording; masks; radiofrequency integrated circuits; CMOS technologies; ESD testing; MOSFET; RFIC; advanced power clamps; electrostatic discharge; magnetic recording; on-chip protection; photomask;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-5853-7057-3
Type :
conf
Filename :
5272050
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3531859
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