Title :
Implementing The Results Of A Manufacturing Simulation In A Semiconductor Line
Author :
Miller, David J.
Author_Institution :
IBM General Technology Division
Keywords :
Analytical models; Contamination; Costs; Lead compounds; Manufacturing processes; Process control; Semiconductor device manufacture; Semiconductor device modeling; Throughput; Virtual manufacturing;
Conference_Titel :
Simulation Conference Proceedings, 1989. Winter
Print_ISBN :
0-911801-58-8
DOI :
10.1109/WSC.1989.718774