DocumentCode :
3532001
Title :
Accurate Measurement for Surface Resistance of a Single Piece of HTS Thin Film
Author :
Zeng, Cheng ; Luo, Zhengxiang ; Yang, Kai ; Zhang, Qishao
Author_Institution :
Sch. of Opto-Electron. Inf., Univ. of Electron. Sci. & Technol., Chengdu
fYear :
2009
fDate :
28-29 April 2009
Firstpage :
1
Lastpage :
4
Abstract :
An improved image type sapphire resonator was developed for accurate measurement of surface resistance of a single piece of high temperature superconductor thin film. The surface resistances of two DC spurting yttrium-barium-copper oxide (YBCO) thin films were measured by TE011 mode of this resonator. TE012 mode of this resonator was also used in the measurement for the determination of the frequency dependence of the surface resistance of the HTS thin film. The high accuracy in the Rs measurement of this resonator is comparable to the one of conventional two-resonator method, while the process is much simpler. The ability for measuring surface resistance of a single HTS thin film and characterizing the frequency dependence of Rs of this sapphire resonator is remarkable.
Keywords :
barium compounds; copper compounds; high-temperature superconductors; sapphire; superconducting thin films; surface resistance; yttrium compounds; Al2O3; HTS thin film; YBCO thin films; YBa2Cu3O7-delta; accurate measurement; high temperature superconductor thin film; sapphire resonator; surface resistance; yttrium-barium-copper oxide; Electrical resistance measurement; Frequency dependence; Frequency measurement; High temperature superconductors; Superconducting thin films; Surface resistance; Tellurium; Transistors; Yttrium barium copper oxide; Yttrium compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
Type :
conf
DOI :
10.1109/CAS-ICTD.2009.4960774
Filename :
4960774
Link To Document :
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