DocumentCode
3532084
Title
Analog-Circuit Fault Diagnosis Using Three-Stage Preprocessing and Time Series Data Mining
Author
He, Weisong ; Xiang, Hongmei ; Tang, Jingyuan
Author_Institution
Key Lab. of Broadband Opt. Fiber Transm. & Commun. Networks, Univ. of Electron. Sci. & Technol. of China, Chengdu
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
4
Abstract
We have developed an analog-circuit fault diagnostic system using three-stage preprocessing and time series data mining approach. Using three-stage approach to preprocess the impulse response drastically reduces the number of inputs, simplifying its architecture and minimizing its processing time. Using time series data mining can identify the type of fault. Simulation result verify our method.
Keywords
analogue circuits; data mining; fault diagnosis; integrated circuit modelling; integrated circuit testing; time series; analog circuit fault diagnosis; impulse response; three stage preprocessing; time series data mining; Automation; Circuit faults; Circuit simulation; Circuit testing; Data mining; Electronic circuits; Embedded computing; Fault diagnosis; Helium; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960780
Filename
4960780
Link To Document