Title :
Analog-Circuit Fault Diagnosis Using Three-Stage Preprocessing and Time Series Data Mining
Author :
He, Weisong ; Xiang, Hongmei ; Tang, Jingyuan
Author_Institution :
Key Lab. of Broadband Opt. Fiber Transm. & Commun. Networks, Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
We have developed an analog-circuit fault diagnostic system using three-stage preprocessing and time series data mining approach. Using three-stage approach to preprocess the impulse response drastically reduces the number of inputs, simplifying its architecture and minimizing its processing time. Using time series data mining can identify the type of fault. Simulation result verify our method.
Keywords :
analogue circuits; data mining; fault diagnosis; integrated circuit modelling; integrated circuit testing; time series; analog circuit fault diagnosis; impulse response; three stage preprocessing; time series data mining; Automation; Circuit faults; Circuit simulation; Circuit testing; Data mining; Electronic circuits; Embedded computing; Fault diagnosis; Helium; System testing;
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
DOI :
10.1109/CAS-ICTD.2009.4960780
