DocumentCode
3532108
Title
Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry
Author
Rao, E.V.K. ; Gottesman, Y.
Author_Institution
Lab. de Photonique et de Nanostructures, CNRS, Marcoussis, France
fYear
2003
fDate
12-16 May 2003
Firstpage
544
Lastpage
545
Abstract
Describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).
Keywords
III-V semiconductors; indium compounds; integrated optoelectronics; optical communication equipment; optical testing; reflectometry; DBR lasers; EAMs; InP; InP-based photonic components; MMI couplers; bend guides; butt-joints; design; fabrication techniques; low-coherence reflectometry; performance diagnosis; photonic circuits; process; Circuits; Couplers; Design optimization; Distributed Bragg reflectors; Optical design; Optical design techniques; Optical device fabrication; Optical devices; Process design; Reflectometry;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN
0-7803-7704-4
Type
conf
DOI
10.1109/ICIPRM.2003.1205437
Filename
1205437
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