Title :
Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry
Author :
Rao, E.V.K. ; Gottesman, Y.
Author_Institution :
Lab. de Photonique et de Nanostructures, CNRS, Marcoussis, France
Abstract :
Describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).
Keywords :
III-V semiconductors; indium compounds; integrated optoelectronics; optical communication equipment; optical testing; reflectometry; DBR lasers; EAMs; InP; InP-based photonic components; MMI couplers; bend guides; butt-joints; design; fabrication techniques; low-coherence reflectometry; performance diagnosis; photonic circuits; process; Circuits; Couplers; Design optimization; Distributed Bragg reflectors; Optical design; Optical design techniques; Optical device fabrication; Optical devices; Process design; Reflectometry;
Conference_Titel :
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN :
0-7803-7704-4
DOI :
10.1109/ICIPRM.2003.1205437
