• DocumentCode
    3532172
  • Title

    An analysis of fault effects and propagations in ZPU: The world´s smallest 32 bit CPU

  • Author

    Zandrahimi, Mahroo ; Zarandi, Hamid R. ; Rohani, Alireza

  • Author_Institution
    Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ., Tehran, Iran
  • fYear
    2010
  • fDate
    3-4 Aug. 2010
  • Firstpage
    308
  • Lastpage
    313
  • Abstract
    This paper presents an analysis of the effects and propagations of transient faults by simulation-based fault injection into the ZPU processor. This analysis is done by injecting 5800 transient faults into the main components of ZPU processor that is described in VHDL language. The sensitivity level of various points of ZPU processor such as PC, SP, IR, Controller, and ALU against fault manifestation is considered and evaluated. The behavior of ZPU processor against injected faults is reported. Besides, it is shown that about 50.25% of faults are recovered during simulation time; 46.47% of faults are effective and the remainders 3.28% of faults are latent. Moreover, a comparison of the behavior of ZPU processor in fault injection experiments against some common microprocessors is done. The results will be used in the future research for proposing a fault-tolerant mechanism for ZPU processor.
  • Keywords
    hardware description languages; microprocessor chips; ALU; CPU; IR; PC; SP; VHDL language; ZPU processor; controller; fault effect analysis; fault manifestation; fault-tolerant mechanism; microprocessor; simulation-based fault injection; transient fault propagation; word length 32 bit; Analytical models; Computer science; Fault tolerance; Hardware design languages; Information analysis; Information technology; Microcontrollers; Microprocessors; Single event transient; Transient analysis; Fault injection; Simulation-based; Transient fault;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4244-7809-5
  • Type

    conf

  • DOI
    10.1109/ASQED.2010.5548320
  • Filename
    5548320