• DocumentCode
    3532176
  • Title

    The effect of edge artifacts on quantification of Positron Emission Tomography

  • Author

    Bai, Bing ; Esser, Peter D.

  • Author_Institution
    Dept. of Radiol., Columbia Univ., New York, NY, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    2263
  • Lastpage
    2266
  • Abstract
    We examined the quantitative effect of the edge artifacts caused by using a point spread function (PSF) system model for Positron Emission Tomography (PET) image reconstruction. Two phantoms were used in this study. The first phantom was a new small PET phantom that was used to measure the quantitative effects. The cylindrical phantom had 5 hot cylinder inserts with different diameters and was scanned with different hot insert-to-background ratios. Results showed that the region of interest (ROI) mean value (equal diameters for ROIs and cylinders) of PSF-OSEM was higher than that of OSEM without PSF model due to better resolution recovery, and the total activity was preserved in all images. However the ROI maximum value of PSF-OSEM could be significantly higher than the true value, and this overshoot depends on both the cylinder size and the concentration ratio. The largest effect was observed with the 8mm diameter cylinder insert at the highest concentration ratio. The second phantom was a Hoffman brain phantom, which was used to display the effect visually without quantitative measurements.
  • Keywords
    brain; expectation-maximisation algorithm; image reconstruction; medical image processing; optical transfer function; phantoms; positron emission tomography; Hoffman brain phantom; OSEM; edge artifacts; image reconstruction; insert-to-background ratios; point spread function; positron emission tomography; Image edge detection; Image reconstruction; Imaging phantoms; Phantoms; Positron emission tomography; Smoothing methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874186
  • Filename
    5874186