DocumentCode :
3532314
Title :
Low noise MFM with high resolution by tip cooling
Author :
Saito, H. ; Sunahara, R. ; Rheem, Y.W. ; Ishio, S.
Author_Institution :
Dept. of Mater. Sci. & Eng., Akita Univ., Japan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
707
Lastpage :
708
Abstract :
An equipment to cool magnetic force microscope (MFM) tips is attached to a commercial MFM . The temperature dependence of MFM noise and estimated MFM resolution is investigated using MFM spectrum. From these attempts, a low noise MFM with high resolution by tip cooling is developed.
Keywords :
cooling; image resolution; magnetic force microscopy; magnetic noise; MFM noise; MFM spectrum; magnetic force microscopy; resolution; temperature dependence; tip cooling; Cooling; Magnetic force microscopy; Magnetic noise; Noise reduction; Optical noise; Resonant frequency; Spatial resolution; Temperature dependence; Temperature sensors; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463782
Filename :
1463782
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3532314
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