DocumentCode
35327
Title
Sketch Matching on Topology Product Graph
Author
Shuang Liang ; Jun Luo ; Wenyin Liu ; Yichen Wei
Author_Institution
Sch. of Software Eng., Tongji Univ., Shanghai, China
Volume
37
Issue
8
fYear
2015
fDate
Aug. 1 2015
Firstpage
1723
Lastpage
1729
Abstract
Sketch matching is the fundamental problem in sketch based interfaces. After years of study, it remains challenging when there exists large irregularity and variations in the hand drawn sketch shapes. While most existing works exploit topology relations and graph representations for this problem, they are usually limited by the coarse topology exploration and heuristic (thus suboptimal) similarity metrics between graphs. We present a new sketch matching method with two novel contributions. We introduce a comprehensive definition of topology relations, which results in a rich and informative graph representation of sketches. For graph matching, we propose topology product graph that retains the full correspondence for matching two graphs. Based on it, we derive an intuitive sketch similarity metric whose exact solution is easy to compute. In addition, the graph representation and new metric naturally support partial matching, an important practical problem that received less attention in the literature. Extensive experimental results on a real challenging dataset and the superior performance of our method show that it outperforms the state-of-the-art.
Keywords
computer graphics; graph theory; graph matching; graph representations; partial matching; sketch matching method; topology product graph; Complexity theory; Geometry; Shape; Topology; Vectors; Weight measurement; Similarity Metrics; Sketch Matching; Sketch matching; Topology Relations; similarity metrics; topology relations;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2014.2369031
Filename
6951498
Link To Document