DocumentCode :
3532832
Title :
High-Speed Multi-Channel Multi-Threshold Level Sampling Test: Detected 1GHz Digital Signal by Agilent 16903A Logic Analyzer
Author :
Tang, Kai ; Meng, Qiao ; Liu, Hai-tao
Author_Institution :
Inst. of RF- & OE-ICs (IROI), Southeast Univ. (SEU), Nanjing
fYear :
2009
fDate :
28-29 April 2009
Firstpage :
1
Lastpage :
4
Abstract :
The highest sampling rate of Agilent 16903A logic analyzer is 4 GHz and the maximum input channel bandwidth is 250 MHz. We can not accurately judge the logic levels of more than 250 MHz input signal because of the input channel bandwidth limitation, and thus we can not collect the right data at a higher rate of input signal. The issue had been deeply studied. In order to access a higher speed output data, we used a multi-channel multi-threshold level method to collect data, and then got the correct output result after processing it. We successfully developed this approach in high-speed ADC measurement. It breaks the bandwidth limitation, greatly enhances the performance of the instrument and is proved to be a feasible and effective testing program.
Keywords :
logic analysers; signal detection; signal sampling; Agilent 16903A logic analyzer; bandwidth 250 MHz; data collection; digital signal detection; frequency 1 GHz; frequency 4 GHz; high-speed ADC measurement; high-speed multi-channel multi-threshold level sampling test; input channel bandwidth limitation; Bandwidth; Capacitance; Circuit testing; Clocks; Frequency synchronization; Logic testing; Sampling methods; Signal analysis; Signal detection; Signal sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
Type :
conf
DOI :
10.1109/CAS-ICTD.2009.4960830
Filename :
4960830
Link To Document :
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