• DocumentCode
    3533050
  • Title

    Neural network based approach for quality improvement of orbital arc welding joints

  • Author

    Koleva, Elena ; Christova, Nikolinka ; Velev, Kamen

  • Author_Institution
    Inst. of Electron., Bulgarian Acad. of Sci., Sofia, Bulgaria
  • fYear
    2010
  • fDate
    7-9 July 2010
  • Firstpage
    290
  • Lastpage
    295
  • Abstract
    Neural network based models are developed and used for the description of the relations of the geometry characteristics of Steel 3 welds from orbital arc welding (OAW) process parameters. This integrated methodology is implemented together with response surface methodology (statistical approach) for the investigation of the defined as quality characteristics: outer and inner weld widths. Both implemented modeling approaches are compared and their applicability is discussed. Regression models are estimated and neural networks were trained using a set of experimental data containing different welding regime conditions (pipe diameter and thickness, welding current and time for one full turn of the electrode). The implementation of both approaches and their applicability for process optimization and automatic control aiming improving of the quality of the obtained welds is compared.
  • Keywords
    arc welding; neural nets; optimisation; regression analysis; response surface methodology; automatic control; geometry characteristics; inner weld widths; neural network based approach; orbital arc welding joints; orbital arc welding process parameters; outer weld widths; process optimization; quality improvement; regression models; response surface methodology; steel 3 welds; welding regime conditions; Automatic control; Chemical technology; Electrical equipment industry; Industrial control; Intelligent systems; Neural networks; Power system modeling; Process control; Response surface methodology; Welding; component; neural network models; orbital arc welding; response surface methodology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems (IS), 2010 5th IEEE International Conference
  • Conference_Location
    London
  • Print_ISBN
    978-1-4244-5163-0
  • Electronic_ISBN
    978-1-4244-5164-7
  • Type

    conf

  • DOI
    10.1109/IS.2010.5548385
  • Filename
    5548385