DocumentCode :
353306
Title :
A neural network approach to maximum likelihood estimation for eddy-current back-scattering NDE data inversion
Author :
Fiori, Simone ; Burrascano, Pietro
Author_Institution :
Dept. of Ind. Eng., Perugia Univ., Italy
Volume :
5
fYear :
2000
fDate :
2000
Firstpage :
65
Abstract :
The aim of this paper is to present a neural network approach to crack location based on eddy-current backscattering measured data inversion. A deep defect inside a conductive object may be revealed by sliding an electromagnetic probe over the object´s accessible surface: this operation gives a set of differential impedance measures, whose configuration carries information on both the shape and the location of the crack. By inverting the measured impedance data it is thus possible to reconstruct the geometry of the defect. Commonly employed data inversion techniques, such as the one based on maximum likelihood theory, require the availability of a forward model which describes the way the data are generated by the system under test. When a physical model is not available or is too much difficult to be handled, a suitable black-box model could be used instead. In this paper we propose the use of a multilayer perceptron for this purpose, which proved to be effective because of its well-known function approximation and system identification capabilities
Keywords :
crack detection; eddy current testing; electric impedance measurement; maximum likelihood estimation; mechanical engineering computing; multilayer perceptrons; accessible surface; black-box model; conductive object; crack location; deep defect; defect geometry reconstruction; differential impedance measures; eddy-current back-scattering NDE data inversion; electromagnetic probe; forward model; function approximation; maximum likelihood estimation; multilayer perceptron; neural network; system identification; Backscatter; Electromagnetic measurements; Impedance measurement; Maximum likelihood estimation; Neural networks; Probes; Shape measurement; Surface cracks; Surface impedance; Surface reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 2000. IJCNN 2000, Proceedings of the IEEE-INNS-ENNS International Joint Conference on
Conference_Location :
Como
ISSN :
1098-7576
Print_ISBN :
0-7695-0619-4
Type :
conf
DOI :
10.1109/IJCNN.2000.861436
Filename :
861436
Link To Document :
بازگشت