• DocumentCode
    3533171
  • Title

    Phase Synchronization Errors on Near-Space Passive Bistatic Radar Imaging

  • Author

    Wang, Wen-Qin ; Peng, Qicong ; Cai, Jingye

  • Author_Institution
    Sch. of Commun. & Inf. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
  • fYear
    2009
  • fDate
    28-29 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Near-space passive bistatic radar involves a passive receiver placed inside a near-space platform is in conjunction with one opportunistic illuminator. This spatial configuration has many operational advantages such as improved capability, reliability, and flexibility. However, high-precision phase synchronization must be ensured. So accurate simulation of phase synchronization errors is of great importance during designing and developing of near-space passive bistatic radar systems. This paper concentrates on the prediction of phase synchronization errors due to limited oscillator frequency stability between opportunistic illuminator and passive receiver. With statistical models of phase noise, an analytical expression of phase synchronization errors is derived and some simulations are performed. Moreover, the impact of phase synchronization errors on bistatic radar imaging performance is investigated. Simulation results show that phase synchronization errors may degrade the imaging performance greatly and some synchronization compensation techniques should be developed. Hence, some possible solutions are investigated.
  • Keywords
    frequency stability; passive radar; phase noise; radar imaging; radar receivers; statistical analysis; synchronisation; compensation technique; near-space passive bistatic radar imaging; oscillator frequency stability; phase noise; phase synchronization error; radar receiver; statistical model; Bistatic radar; Degradation; Frequency synchronization; Low earth orbit satellites; Low-frequency noise; Oscillators; Phase noise; Predictive models; Spaceborne radar; White noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-2587-7
  • Type

    conf

  • DOI
    10.1109/CAS-ICTD.2009.4960854
  • Filename
    4960854