DocumentCode
3533221
Title
A patchwork (back)projector to accelerate artifact reduction in CT reconstruction
Author
Van Slambrouck, Katrien ; Nuyts, Johan
Author_Institution
Dept. of Nucl. Med., K.U. Leuven, Leuven, Belgium
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
2625
Lastpage
2629
Abstract
Artifacts in computed tomography (CT) reconstruction are often caused by an inaccurate modeling of the acquisition during reconstruction. These artifacts can be severe when metals are in the field of view. A better modeling of the acquisition during reconstruction reduces artifacts but often leads to a substantial increase in computation time. Because metals are the most prominent source of the artifacts, we hypothesize it would be sufficient to limit the more complex model to regions close to metals and use less complex, faster models for the other parts. For this purpose we present a patchwork (back)projector, embedded in an iterative reconstruction algorithm, which is able to change reconstruction properties for a particular area in the object. We combined reconstruction models with different complexity for the reduction of non-linear partial volume effects and beam hardening. In this way we reduced the computation time while keeping the same image quality. Moreover, an improved convergence is achieved by dividing the image into subareas, patches. The presented results are for a two dimensional geometry, in the future we will extend this to three dimensions.
Keywords
computerised tomography; image reconstruction; iterative methods; medical image processing; CT reconstruction; artifact reduction; beam hardening; computed tomography; image quality; iterative reconstruction algorithm; nonlinear partial volume effects; patchwork backprojector; Computational modeling; Computed tomography; Convergence; Detectors; Image reconstruction; Metals; Pixel;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874265
Filename
5874265
Link To Document