• DocumentCode
    3533221
  • Title

    A patchwork (back)projector to accelerate artifact reduction in CT reconstruction

  • Author

    Van Slambrouck, Katrien ; Nuyts, Johan

  • Author_Institution
    Dept. of Nucl. Med., K.U. Leuven, Leuven, Belgium
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    2625
  • Lastpage
    2629
  • Abstract
    Artifacts in computed tomography (CT) reconstruction are often caused by an inaccurate modeling of the acquisition during reconstruction. These artifacts can be severe when metals are in the field of view. A better modeling of the acquisition during reconstruction reduces artifacts but often leads to a substantial increase in computation time. Because metals are the most prominent source of the artifacts, we hypothesize it would be sufficient to limit the more complex model to regions close to metals and use less complex, faster models for the other parts. For this purpose we present a patchwork (back)projector, embedded in an iterative reconstruction algorithm, which is able to change reconstruction properties for a particular area in the object. We combined reconstruction models with different complexity for the reduction of non-linear partial volume effects and beam hardening. In this way we reduced the computation time while keeping the same image quality. Moreover, an improved convergence is achieved by dividing the image into subareas, patches. The presented results are for a two dimensional geometry, in the future we will extend this to three dimensions.
  • Keywords
    computerised tomography; image reconstruction; iterative methods; medical image processing; CT reconstruction; artifact reduction; beam hardening; computed tomography; image quality; iterative reconstruction algorithm; nonlinear partial volume effects; patchwork backprojector; Computational modeling; Computed tomography; Convergence; Detectors; Image reconstruction; Metals; Pixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874265
  • Filename
    5874265